Displaying posts by author: Charles Duvic

Are you familiar with a Focused Ion Beam? Also known as FIB, focused ion beam systems have been produced commercially for more than twenty years and are primarily used for large semiconductor manufacturers. These FIB systems operate in a similar way to a scanning electron microscope (SEM), however, in place of a beam of electrons, FIB systems use a focused beam of gallium ions instead. These ions can also be incorporated at low beam currents for imaging or high beam currents for site specific milling or sputtering.

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