Are you familiar with a Focused Ion Beam? Also known as FIB, focused ion beam systems have been produced commercially for more than twenty years and are primarily used for large semiconductor manufacturers. These FIB systems operate in a similar way to a scanning electron microscope (SEM), however, in place of a beam of electrons, FIB systems use a focused beam of gallium ions instead. These ions can also be incorporated at low beam currents for imaging or high beam currents for site specific milling or sputtering.

The latest FIB systems have high resolution imaging capability and this capability mixed with "in situ" sectioning has eliminated the need, in most cases, to look at FIB sectioned specimens in a separate SEM instrument. SEM imaging is mandatory for the highest resolution imaging and to prevent further damage to sensitive samples. It's also important to mention that the combination of SEM and FIB columns onto the same chamber facilitates the benefits of both to be applied.

At Ladd Research, we have a variety of FIB products in our inventory. We currently offer Lift-Out Grids, Fortress FIB Holders (High Profile) & Fortress FIB Holders (Low Profile) options. Here's a quick look into FIB related products:

Lift-Out Grids:Our lift-out grids are designed to accept lamellae prepared by FIB or FIB/SEM systems.

Specifications:

• Can hold up to 8 samples
• Made from molybdenum and are 3.0mm in diameter
• Allows back side milling
• Easy access from front and back
• Silicon protects the area of interest (AOI)
• Packaged 50 per box in no-VOC gel-pak boxes

 See the full product description here.

Fortress FIB Holder - High Profile: High Profile Fortress FIB Holder to hold a standard FIB lift out specimen on a grid.

Fortress FIB Holders are reusable holders that secure FIB samples that are held in a specific orientation without the use of adhesives, adhesive pads, or conductive paint. Fortress FIB Holders can be used to position a thin, whole or cut TEM grid/disk in an orientation such that either an in-situ or an ex-situ FIB lift-out technique can be used to attach a FIB-prepared sample. The Fortress holders will accept a 3 mm disk or a specially prepared diced sample used for H-bar preparation. Physical protection of the mounted sample on the grid is provided with the CastleGuard protection design. CastleGuard protection provides a rigid support structure that shields the sample while allowing required access for processing. Fortress FIB Holders are designed to fit into the SS200 SampleSaver storage container for storage and transport in an inert environment. Up to 30 FortressTM FIB holders can be stored in a single SS200 SampleSaver storage container. Up to 10 Fortress FIB holders can be stored in a single SS100 SampleSaver storage container. See the full product description here.

Fortress FIB Holder - Low Profile: Low Profile Fortress FIB Holder to hold either a standard FIB lift out specimen on a grid or an H-Bar diced-cut sample. See the full product description here.

If you have any questions or need further details on these products, please give us a call at (800) 451-3406