Page 2 | Scanning Electron Microscopy Supplies | SEM & TEM Apertures

Cameca 800 µm 45° Mirror Aperture

45° Mirror aperture. Made of molybdenum or platinum. 0.236" x 0.004" thick 800 µm Aperture Diameter Other sizes and materials available on request.

Starting at: $101.00

Cameca Electron Microscope Beam Regulation Disc Aperture

Aperture for beam regulation. Made of molybdenum or platinum. 0.470" x 0.004" thick Other sizes and materials available on request.

Starting at: $94.00

Siemens, Cambridge Electron Microscope Disc Apertures

Disc size - 2 mm x 0.50 mm Other holes sizes available

Click Here for self cleaning apertures of this type

Starting at: Call For Price

Self-Cleaning Apertures - Philips Type - Gold Foil - 3mm x 0.25mm

Starting at: Call For Price

Camscan, ISI, Topcon Electron Microscope Disc Aperture

Camscan, ISI, Topcon Disc Apertures Disc size - 4 mm x 0.165 mm Other hole sizes available. Please contact us with your request

Starting at: Call For Price

JEOL Electron Microscope Disc Apertures

Disc size - 6 mm x 0.24 mm Need a hole size not shown above? We manufacture any hole size you need, just call or e-mail your requirements and we can quote you.

Starting at: Call For Price

64025 - Image Quality Checker

A specimen of 200 mesh gold screening is firmly affixed to an SEM specimen mount. This provides a quick method of determining image quality. Good surface detail discernible at reasonably high magnification. Will not oxidize.

Please state specimen mount required.

$40.95

64010 - Grating - "Waffle"

Replica specifically made for SEM use is taken from a ruled diffraction grating with two sets of lines ruled at right angles to each other. There are 54,864 lines per inch in both directions. A 50 mesh screen is placed over entire grating for strength. Useful for magnification determination, detection and measurement of lens distortion, and the determination of the degree of fore-shortening in an image, as a function of specimen tilt. Measurement chart and instructions included.

Please specify the type of specimen mount required.

$69.95

64007 - Grating - 28,800 lines per inch

Replica taken from a ruled diffraction grating. Useful for magnification of 3000x to 30,000x. A 50 mesh screen is placed over entire grating for strength. Measurement chart and instructions included.

Please specify the type of specimen mount required.

$68.95

64005 - Grating - 15,240 lines per inch

Made specifically for use in SEM's. This replica is taken from a ruled diffraction grating with 15,240 lines per inch. Very useful for magnification determination in the range of 1000x to 15,000x. A 50 mesh screen is placed over entire grating for strength. Measurement chart and instructions included.

Please specify the type of specimen mount required.

$68.95

Oval JEOL Four Hole Strip Apertures - Platinum

4 Hole Oval Platinum (Platinum:Iridium 95:5) Strips 10.0mm long X 5.0mm wide X 0.10mm thick.

We also offer similar strips in Molybdenum. Please click HERE for molybdenum apertures.

We can manufacture any hole size in any combination you require. Please e-mail your specifications if you don't find what you need below.

Starting at: $665.00

64015 - Composite Magnification Test Specimen

Composed of three magnification specimens attached firmly to a scanning microscope specimen mount. One specimen is 400 mesh copper screening for low magnification work. The middle specimen is a 15,240 line per inch grating for the high magnification range. The third specimen is a 1,500 mesh nickel screening for the middle magnification range. 50 mesh screening is placed over entire grating for strength. This composite specimen is both a time and space saver. Measurement charts and instructions for use included.

Please specify the type of specimen mount required.

$139.95

64000 - Low Magnification Calibration Specimen

Precision 400 mesh copper screening and 1000 mesh nickel screening is affixed to a specimen mount to aid in calibrating specimens at magnifications from 50x to 1000x.

Please specify the type of specimen mount required.

$43.95

53130 - SEM Performance Standard

A certified test and performance sample for the SEM. Vapor deposited aluminum on a silicon substrate. Photo lithographed and etched. Ten separate measurements and tests may be performed with this one standard. Dimensions are printed near each target area. May be used for magnification calibration, magnification center and scan rotation center, geometry errors and pin cushion distortion, depth of field measurements, dynamic focus performance and tilt correction, orthogonality and linearity tests, stage motion tests and video performance and video loop stability. Instructions included. NBS Certified.

Please specify type of specimen mount required.

$1,795.00