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A certified test and performance sample for the SEM. Vapor deposited aluminum on a silicon substrate. Photo lithographed and etched. Ten separate measurements and tests may be performed with this one standard. Dimensions are printed near each target area. May be used for magnification calibration, magnification center and scan rotation center, geometry errors and pin cushion distortion, depth of field measurements, dynamic focus performance and tilt correction, orthogonality and linearity tests, stage motion tests and video performance and video loop stability. Instructions included. NBS Certified.

Please specify type of specimen mount required.