X-Checker for SEM-EDS

Quick Overview

The X-Checker is a calibration aid to help monitor the performance of an EDS X-ray system on an SEM. The X-Checker contains a series of standard materials on a 1" diameter aluminum stub.

With the X-Checker, the investigator can check detector resolution and calibration, test for contamination on the detector window, monitor low-end sensitivity and calibrate image analysis software.

Availability: In stock

Product Name Price Qty
64030 - X-Checker Standard - With Al, Cu, C, Mn and 2 Ni grids - 40 x 40 microns and 18 x 18 microns
$635.00
64033 - X-Checker BN - Like 64030 but with the addition of Boron Nitride
$735.00
64035 - X-Checker Extra - Like 64033 but with the addition of fluorine and beryllium and without the 18 x 18 micron Ni grid
$835.00
 

The X-Checker is a calibration aid to help monitor the performance of an EDS X-ray system on an SEM. The X-Checker contains a series of standard materials on a 1" diameter aluminum stub. With the X-Checker, the investigator can check detector resolution and calibration, test for contamination on the detector window, monitor low-end sensitivity and calibrate image analysis software.

Boron Nitride - checks low-end sensitivity
Fluorine - Tests low end resolution
Beryllium - Tests sensitivity at the extreme low end

SKU 64030-64035
Hazardous Materials No
Product Brand --- None ---
Featured Product No
Featured Order No

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