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Composed of three magnification specimens attached firmly to a scanning microscope specimen mount. One specimen is 400 mesh copper screening for low magnification work. The middle specimen is a 15,240 line per inch grating for the high magnification range. The third specimen is a 1,500 mesh nickel screening for the middle magnification range. 50 mesh screening is placed over entire grating for strength. This composite specimen is both a time and space saver. Measurement charts and instructions for use included.

Please specify the type of specimen mount required.

Precision 400 mesh copper screening and 1000 mesh nickel screening is affixed to a specimen mount to aid in calibrating specimens at magnifications from 50x to 1000x.

Please specify the type of specimen mount required.

A certified test and performance sample for the SEM. Vapor deposited aluminum on a silicon substrate. Photo lithographed and etched. Ten separate measurements and tests may be performed with this one standard. Dimensions are printed near each target area. May be used for magnification calibration, magnification center and scan rotation center, geometry errors and pin cushion distortion, depth of field measurements, dynamic focus performance and tilt correction, orthogonality and linearity tests, stage motion tests and video performance and video loop stability. Instructions included. NBS Certified.

Please specify type of specimen mount required.