The Tripod Polisher was designed by researchers at the IBM East Fishkill Laboratory to accurately prepare TEM and SEM samples of pre-specified, micron-sized regions. For TEM Samples, this technique has been used successfully to limit ion milling times to less than 15 minutes and, in some cases, has eliminated the need for ion milling. Although this technique was designed for preparing semiconductor cross-sections, it has been used to prepare both plan-view and cross-section samples from such diverse materials as ceramics, composites, metals and geological samples. Order online or call (800) 451-3406.
A round aluminum disc with a Pyrex rod mounted into the center of the disc. This assembly is mounted to the base of the Tripod Polisher and is primarily used for plan parallel polishing of specimens. Learn More
A round stainless steel disc. This assembly is mounted to the base of the Tripod Polisher and is primarily used for plan parallel polishing of specimens. 1.25" Diameter Learn More
Designed to accept the special SEM stud used with the Tripod Polisher. The SEM stud is mounted in the Ion Mill Stage and sample is briefly ion milled to remove fine scratches, polishing debris and to give surface topography prior to SEM analysis. Learn More
This bracket utilizes a small clamping mechanism on the face of the bracket to allow samples to be clamped without the need for using mounting waxes. Learn More
The Tripod Polisher, L590TS, comes complete with sufficient accessories to prepare samples for both scanning electron microscopy (SEM) and transmission electron microscopy (TEM).
The following accessories are included at no charge with the purchase of the L590TS. (prices are included if you wish to purchase additional accessories) Learn More
The Tripod Polisher, L590TEM, comes complete with sufficient accessories to prepare samples for transmission electron microscopy (TEM).
The following accessories are included at no charge with the purchase of the L590TEM. (prices are included if you wish to purchase additional accessories) Learn More