The Tripod Polisher was designed by researchers at the IBM East Fishkill Laboratory to accurately prepare TEM and SEM samples of pre-specified, micron-sized regions. For TEM Samples, this technique has been used successfully to limit ion milling times to less than 15 minutes and, in some cases, has eliminated the need for ion milling. Although this technique was designed for preparing semiconductor cross-sections, it has been used to prepare both plan-view and cross-section samples from such diverse materials as ceramics, composites, metals and geological samples. Order online or call (800) 451-3406.
The Tripod Polisher, L590SEM, comes complete with sufficient accessories to prepare samples for scanning electron microscopy (SEM).
The following accessories are included at no charge with the purchase of the L590SEM. (prices included if you wish to purchase additional accessories) Learn More
The Tripod Polisher, L590TEM, comes complete with sufficient accessories to prepare samples for transmission electron microscopy (TEM).
The following accessories are included at no charge with the purchase of the L590TEM. (prices are included if you wish to purchase additional accessories) Learn More
The Tripod Polisher, L590TS, comes complete with sufficient accessories to prepare samples for both scanning electron microscopy (SEM) and transmission electron microscopy (TEM).
The following accessories are included at no charge with the purchase of the L590TS. (prices are included if you wish to purchase additional accessories) Learn More
Designed to hold the Tripod Polisher upside down to allow for viewing the specimen under a dissecting microscope. The stand can also be used as a storage device in between processing steps. Learn More
A large square aluminum block which is designed to be used on a hot plate. The block provides a stable platform onto which the L brackets can be placed and heated to the proper temperature for mounting specimens. Learn More
The SEM stub mount is designed specifically for mounting specimens for SEM polishing. It fits directly into the stage of most standard SEM stages and eliminates the need for remounting the specimen prior to SEM observation. Included at no charge with the purchase of the BiPod Polisher. Learn More
The most commonly used bracket. It has a slot through the front to accommodate the Pyrex inserts for wedge polishing, the SEM stub mount, as well as the L59002 Wedge Polishing Mount. Learn More
Designed specifically for doing the first side polishing of TEM specimens. However, the plain L bracket can be used for polishing SEM cross sections if additional mounting prior to microscope viewing is to be done. Learn More
Used with L03090 or L03067 and clamps the small pyrex rods into the L590. The clamp is anodized aluminum and squeezes against the pyrex rod, holding it in place. Included at no charge with the purchase of the BiPod Polisher. Learn More
Similar in function to the Pyrex insert. Specimens are mounted to the rod for wedge polishing applications. Included at no charge with the purchase of the BiPod Polisher. Learn More
This insert is a glass stub used for TEM polishing of specimens. It is used in conjunction with the slotted L bracket and is used for wedge polishing applications. Not included with the purchase of the BiPod Polisher. Learn More
This bracket utilizes a small clamping mechanism on the face of the bracket to allow samples to be clamped without the need for using mounting waxes. Learn More
Designed to accept the special SEM stud used with the Tripod Polisher. The SEM stud is mounted in the Ion Mill Stage and sample is briefly ion milled to remove fine scratches, polishing debris and to give surface topography prior to SEM analysis. Learn More
A round stainless steel disc. This assembly is mounted to the base of the Tripod Polisher and is primarily used for plan parallel polishing of specimens. 1.25" Diameter Learn More
A round aluminum disc with a Pyrex rod mounted into the center of the disc. This assembly is mounted to the base of the Tripod Polisher and is primarily used for plan parallel polishing of specimens. Learn More