The Tripod Polisher was designed by researchers at the IBM East Fishkill Laboratory to accurately prepare TEM and SEM samples of pre-specified, micron-sized regions. For TEM Samples, this technique has been used successfully to limit ion milling times to less than 15 minutes and, in some cases, has eliminated the need for ion milling. Although this technique was designed for preparing semiconductor cross-sections, it has been used to prepare both plan-view and cross-section samples from such diverse materials as ceramics, composites, metals and geological samples. Order online or call (800) 451-3406.
The Tripod Polisher, L590SEM, comes complete with sufficient accessories to prepare samples for scanning electron microscopy (SEM).
The following accessories are included at no charge with the purchase of the L590SEM. (prices included if you wish to purchase additional accessories) Learn More
The Tripod Polisher, L590TEM, comes complete with sufficient accessories to prepare samples for transmission electron microscopy (TEM).
The following accessories are included at no charge with the purchase of the L590TEM. (prices are included if you wish to purchase additional accessories) Learn More
The Tripod Polisher, L590TS, comes complete with sufficient accessories to prepare samples for both scanning electron microscopy (SEM) and transmission electron microscopy (TEM).
The following accessories are included at no charge with the purchase of the L590TS. (prices are included if you wish to purchase additional accessories) Learn More
Designed to hold the Tripod Polisher upside down to allow for viewing the specimen under a dissecting microscope. The stand can also be used as a storage device in between processing steps. Learn More
A large square aluminum block which is designed to be used on a hot plate. The block provides a stable platform onto which the L brackets can be placed and heated to the proper temperature for mounting specimens. Learn More