
Buy Transmission Electron Microscopy Supplies Online
Browse and purchase from a large selection of Transmission Electron Microscopy Supplies that are available at Ladd Research. Find wire saws, grinders, embedding molds, evaporators, and more. Order online or call (800) 451-3406.
40805 - Ferritin
$37.95
If your instrument can resolve the tetrad of this protein molecule it has better than 12.5 Angstroms resolution. Supplied as a pure suspension dispersed upon a formvar substrate. Learn More
L260 - 3-Axis Goniometer - Model 260
$4,800.00
Used to hold crystals in the process of determining crystallographic orientation using either Laue back reflection or optical orientation techniques.
For Low Speed Diamond Wheel Saw II - Model L660 and Wire Saw - Model L850 Learn More
L250 - 2-Axis Goniometer - Model 250
$2,279.00
Used to hold crystals in the process of determining crystallographic orientation using either Laue back reflection or optical orientation techniques.
For Low Speed Diamond Wheel Saw II - Model L660 and Wire Saw - Model L850 Learn More
L59002 - Optional BiPod Polisher Accessory - Wedge Polisher Mount
$195.00
Designed specifically for wedge polishing of TEM specimens. the mount consists of a small aluminum clamping mechanism and 5 Pyrex rods which slide into the center of the clamp and are held in place when the L-bracket is tightened. Not included with the purchase of the BiPod Polisher. Learn More
L03145 - BiPod Polisher Accessory - Foot for BiPod Polisher
$21.00
Priced at $21.00 individually. Included at no charge with the purchase of the BiPod Polisher. Learn More
L03768 - BiPod Polisher Accessory - L Bracket
$102.00
For holding sample securely in BiPod Polisher. Included at no charge with the purchase of the BiPod Polisher. Learn More
40795 - Carbon Test Specimen
$46.95
A high resolution test specimen consisting of a graphitized ISAF carbon black dispersed on "lacey" carbon film supported by a 200 mesh grid. The carbon black chains bridge openings in the film so there is no substrate to interfere with resolution tests. Imaging of the 3.4 Angstrom lattice spacing of the carbon, along with the curved regions and dislocations, permit magnification calibration and check the performance of high resolution electron microscopes. Learn More









