Scanning Electron Microscopy Supplies

Buy SEM Supplies Online - Apertures, Tapes, Paints & Tabs

Ladd Research sells supplies for scanning electron microscopy including Hitachi and Zeiss apertures, calibration and test specimens, tapes, paints, tabs & electron microscope apertures from other top manufacturers.

55500NC - JEOL Noise Canceling Electron Microscope Disc Aperture

$107.00

Disc Size - 6mm x 0.001" Platinum 500µm Learn More

Oval JEOL Four Hole Strip Apertures - Molybdenum

Starting at: Call For Price

4 Hole Oval Molybdenum Strips 10.0mm long X 5.0mm wide X 0.10mm thick.

We also offer similar strips in Platinum. Please click HERE for Platinum apertures.

We can manufacture any hole size in any combination you require. Please e-mail your specifications if you don't find what you need below.

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JEOL / ISI Four Hole Strip Apertures - Platinum

Starting at: Call For Price

4 Hole Platinum (Platinum:Iridium 95:5) Strips 17.0mm long X 5.0mm wide X 0.10mm thick.

We also offer similar strips in Molybdenum. Please click HERE for molybdenum apertures.

We can manufacture any hole size in any combination you require. Please e-mail your specifications if you don't find what you need below.

Learn More

JEOL / ISI Four Hole Strip Apertures - Molybdenum

Starting at: Call For Price

4 Hole Molybdenum Strips 17.0mm long X 5.0mm wide X 0.10mm thick.

We also offer similar strips in Platinum. Please click HERE for platinum apertures.

We can manufacture any hole size in any combination you require. Please e-mail your specifications if you don't find what you need below.

Learn More

Hitachi Four Hole Strip Apertures - Molybdenum

Starting at: Call For Price

45mm long X 4mm wide X 0.1mm thick for Hitachi H600, H59, S520, H11 microscopes and more.

We also make similar strips in platinum. Click HERE for Pt strip apertures.

We can manufacture any hole size in any combination you require. Please e-mail your specifications if you don't find what you need below.

Learn More

X-Checker for SEM-EDS

Starting at: $635.00

The X-Checker is a calibration aid to help monitor the performance of an EDS X-ray system on an SEM. The X-Checker contains a series of standard materials on a 1" diameter aluminum stub. With the X-Checker, the investigator can check detector resolution and calibration, test for contamination on the detector window, monitor low-end sensitivity and calibrate image analysis software. Learn More